sentronics metrology GmbH is world leader in non-contact, non-invasive optical metrology. For over ten years sentronics metrology has been developing and marketing metrology tools with multi sensor configurations for seamless monitoring quality processes in the areas of: wafers, coatings and films.
For many well-known manufacturer in the wafer industry, our metrology and inspection systems stand for quality assurance, precision and process security.
SemDex M – Modular Optical Semiconductor
Metrology Tool with Multi Sensor Configuration
The flexible SemDex M is the base platform for a wide range of semiconductor metrology applications. Diverse measurement configurations and handling options are possible using different sensors, measurement stages and automation hardware.
sentronics metrology GmbH
Phone: +49 621 84251-0
Fax: +49 621 84251-200
JC’s Chunson Limited
No. 19, Jiangdong Avenue, Ma’anshan City, City, China Room 103, Building 100, Xihu Garden, Huashan District
P. R. China
Phone: +86 189 55540168
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