AOI STRATUS NANO inspection
AOI STRATUS NANO inspection: • X/Y resolutions 2μm - 0.2μm per pixel for sub micron defects on circuits • Substrates up to 12 inch (300mm).
AOI STRATUS MICRO inspection
STRATUS MICRO inspection: • X/Y resolutions 20μm - 1μm per pixel for micron size defects on circuits • Substrates up to 24 inch (600mm)
AOI STRATUS 3D inspection
STRATUS 3D inspection: • (Z) Lateral resolutions from 0.5μm, • X/Y resolutions 20μm - 1μm per pixel for micron size defects on circuits • Substrates up to 10 inch (250mm)
Stratus Vision GmbH
Lochhamer Schlag 17
Phone: +49 89 82998910
Fax: +49 89 82998999
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